Pure Silicon TEM windows Strength and Quality Control
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Every batch of TEMwindows is tested for robustness and inspected under the TEM. Prior to packaging, each TEMwindow is individually inspected in an optical microscope.

Below you will find burst pressure values for the Pure Silicon membranes.

temwindow-strength-silicon

Featured publications using Silicon membranes

The following is a list of publications where presented data were collected using silicon membranes from TEMwindows.com.

Non-Porous Pure Silicon

Electron Tomography at 2.4A Resolution Scott MC, Chen CC, Mecklenburg M, Zhu C, Xu R, Ercius P, Dahmen U, Regan BC, Miao J. (2012) Nature. 483: 444-447.

Revealing Correlation of Valence State with Nanoporous Structure in Cobalt Catalyst Xin et al. (2012) ACS Nano. 6(5): 4241-4247.

Direct Imaging and Chemical Analysis of Unstained DNA Origami Performed with a Transmission Electron Microscope Alloyeau D, Ding B, Ramasse Q, Kisielowski C, Lee Z, Jeon KJ. (2011) Chemical Communications. 47: 9375-9377.

Porous Pure Silicon

Quantitative Imaging of Ion Transport through Single Nanopores by High-Resolution Scanning Shen et al. (2012) J Am Chem Soc. 134(24):9856-9

Ion-Selective Permeability of an Ultrathin Nanoporous Silicon Membrane as Probed by Scanning Electrochemical Microscopy Using Micropipet-Supported ITIES Tips Ishimatsu R, Kim J, Jing P, Striemer CC, Fang DZ, Fauchet PM, McGrath JL, Amemiya S. (2010) Analytical Chemistry. 82(17): 7127-7134.