Pure Silicon TEM windows Strength and Quality Control
TEMwindows-Logo
Every batch of TEMwindows is tested for robustness and inspected under the TEM. Prior to packaging, each TEMwindow is individually inspected in an optical microscope.

Nanometer Thinness: Pure Silicon TEM Windows feature imaging windows with 5 to 15 nm thickness, reducing background contribution and interference for higher contrast imaging. Most impressively, 5 nm thick Non-Porous Pure Silicon TEM Windows are thinner than the thinnest commercially available amorphous carbon membranes.

Plasma Cleanable: Unlike traditional carbon grids, samples prepared on PurebSilicon TEM Windows can be vigorously plasma cleaned to remove organic contamination and to improve image quality.

Uniformity: Non-Porous Pure Silicon TEM Windows are more consistently thin than carbon grids, reducing field-to-field variability. (Note: Porous windows do have inherent crystalline features, but feature background-free nanometer-scale pores).

Reduced Chromatic Blur: In comparison to the thinnest commercially available amorphous carbon membranes, 5 nm Non-Porous Pure Silicon TEM Windows yield half the chromatic blur. This dramatic difference results from a two-fold reduction in inelastic scattering of electrons passing through the thinner membranes of Silicon TEM Windows. In turn, the reduced chromatic blur offers a potential two-fold improvement in imaging resolution.

Nanometer-Scale Pores: Pure Silicon TEM Windows are available as porous films with pores ranging from 5 to 50 nm in diameter. The pores allow simple and stable suspension of nanoscale materials for imaging without intervening background.

Silicon Composition: The elemental silicon composition of TEM Windows remarkably increases stability at high beam currents and at high annealing temperatures. The Pure Silicon composition also introduces a minimal background signal, making elemental analyses of sample containing nitrogen and/or carbon possible by EDX and EELS.

Below you will find burst pressure values for the Pure Silicon membranes.

temwindow-strength-silicon

Featured publications using Silicon membranes

The following is a list of publications where presented data were collected using silicon membranes from TEMwindows.com.

Non-Porous Pure Silicon

Electron Tomography at 2.4A Resolution Scott MC, Chen CC, Mecklenburg M, Zhu C, Xu R, Ercius P, Dahmen U, Regan BC, Miao J. (2012) Nature. 483: 444-447.

Revealing Correlation of Valence State with Nanoporous Structure in Cobalt Catalyst Xin et al. (2012) ACS Nano. 6(5): 4241-4247.

Direct Imaging and Chemical Analysis of Unstained DNA Origami Performed with a Transmission Electron Microscope Alloyeau D, Ding B, Ramasse Q, Kisielowski C, Lee Z, Jeon KJ. (2011) Chemical Communications. 47: 9375-9377.

Porous Pure Silicon

Quantitative Imaging of Ion Transport through Single Nanopores by High-Resolution Scanning Shen et al. (2012) J Am Chem Soc. 134(24):9856-9

Ion-Selective Permeability of an Ultrathin Nanoporous Silicon Membrane as Probed by Scanning Electrochemical Microscopy Using Micropipet-Supported ITIES Tips Ishimatsu R, Kim J, Jing P, Striemer CC, Fang DZ, Fauchet PM, McGrath JL, Amemiya S. (2010) Analytical Chemistry. 82(17): 7127-7134.