Plasma Cleanable: Unlike traditional carbon grids, samples prepared on PurebSilicon TEM Windows can be vigorously plasma cleaned to remove organic contamination and to improve image quality.
Uniformity: Non-Porous Pure Silicon TEM Windows are more consistently thin than carbon grids, reducing field-to-field variability. (Note: Porous windows do have inherent crystalline features, but feature background-free nanometer-scale pores).
Reduced Chromatic Blur: In comparison to the thinnest commercially available amorphous carbon membranes, 5 nm Non-Porous Pure Silicon TEM Windows yield half the chromatic blur. This dramatic difference results from a two-fold reduction in inelastic scattering of electrons passing through the thinner membranes of Silicon TEM Windows. In turn, the reduced chromatic blur offers a potential two-fold improvement in imaging resolution.
Nanometer-Scale Pores: Pure Silicon TEM Windows are available as porous films with pores ranging from 5 to 50 nm in diameter. The pores allow simple and stable suspension of nanoscale materials for imaging without intervening background.
Silicon Composition: The elemental silicon composition of TEM Windows remarkably increases stability at high beam currents and at high annealing temperatures. The Pure Silicon composition also introduces a minimal background signal, making elemental analyses of sample containing nitrogen and/or carbon possible by EDX and EELS.
Featured publications using Silicon membranes
The following is a list of publications where presented data were collected using silicon membranes from TEMwindows.com.
Non-Porous Pure Silicon
Electron Tomography at 2.4A Resolution Scott MC, Chen CC, Mecklenburg M, Zhu C, Xu R, Ercius P, Dahmen U, Regan BC, Miao J. (2012) Nature. 483: 444-447.
Revealing Correlation of Valence State with Nanoporous Structure in Cobalt Catalyst Xin et al. (2012) ACS Nano. 6(5): 4241-4247.
Direct Imaging and Chemical Analysis of Unstained DNA Origami Performed with a Transmission Electron Microscope Alloyeau D, Ding B, Ramasse Q, Kisielowski C, Lee Z, Jeon KJ. (2011) Chemical Communications. 47: 9375-9377.
Porous Pure Silicon
Quantitative Imaging of Ion Transport through Single Nanopores by High-Resolution Scanning Shen et al. (2012) J Am Chem Soc. 134(24):9856-9
Ion-Selective Permeability of an Ultrathin Nanoporous Silicon Membrane as Probed by Scanning Electrochemical Microscopy Using Micropipet-Supported ITIES Tips Ishimatsu R, Kim J, Jing P, Striemer CC, Fang DZ, Fauchet PM, McGrath JL, Amemiya S. (2010) Analytical Chemistry. 82(17): 7127-7134.