Pure Silicon TEM windows Strength and Quality Control
Every batch of TEMwindows is tested for robustness and inspected under the TEM. Prior to packaging, each TEMwindow is individually inspected in an optical microscope.

Nanometer Thinness: Pure Silicon TEM Windows feature imaging windows with 5 to 15 nm thickness, reducing background contribution and interference for higher contrast imaging. Most impressively, 5 nm thick Non-Porous Pure Silicon TEM Windows are thinner than the thinnest commercially available amorphous carbon membranes.

Plasma Cleanable: Unlike traditional carbon grids, samples prepared on PurebSilicon TEM Windows can be vigorously plasma cleaned to remove organic contamination and to improve image quality.

Uniformity: Non-Porous Pure Silicon TEM Windows are more consistently thin than carbon grids, reducing field-to-field variability. (Note: Porous windows do have inherent crystalline features, but feature background-free nanometer-scale pores).

Reduced Chromatic Blur: In comparison to the thinnest commercially available amorphous carbon membranes, 5 nm Non-Porous Pure Silicon TEM Windows yield half the chromatic blur. This dramatic difference results from a two-fold reduction in inelastic scattering of electrons passing through the thinner membranes of Silicon TEM Windows. In turn, the reduced chromatic blur offers a potential two-fold improvement in imaging resolution.

Nanometer-Scale Pores: Pure Silicon TEM Windows are available as porous films with pores ranging from 5 to 50 nm in diameter. The pores allow simple and stable suspension of nanoscale materials for imaging without intervening background.

Silicon Composition: The elemental silicon composition of TEM Windows remarkably increases stability at high beam currents and at high annealing temperatures. The Pure Silicon composition also introduces a minimal background signal, making elemental analyses of sample containing nitrogen and/or carbon possible by EDX and EELS.

Below you will find burst pressure values for the Pure Silicon membranes.


Featured publications using Silicon membranes

The following is a list of publications where presented data were collected using silicon membranes from TEMwindows.com.

Non-Porous Pure Silicon

Electron Tomography at 2.4A Resolution Scott MC, Chen CC, Mecklenburg M, Zhu C, Xu R, Ercius P, Dahmen U, Regan BC, Miao J. (2012) Nature. 483: 444-447.

Revealing Correlation of Valence State with Nanoporous Structure in Cobalt Catalyst Xin et al. (2012) ACS Nano. 6(5): 4241-4247.

Direct Imaging and Chemical Analysis of Unstained DNA Origami Performed with a Transmission Electron Microscope Alloyeau D, Ding B, Ramasse Q, Kisielowski C, Lee Z, Jeon KJ. (2011) Chemical Communications. 47: 9375-9377.

Porous Pure Silicon

Quantitative Imaging of Ion Transport through Single Nanopores by High-Resolution Scanning Shen et al. (2012) J Am Chem Soc. 134(24):9856-9

Ion-Selective Permeability of an Ultrathin Nanoporous Silicon Membrane as Probed by Scanning Electrochemical Microscopy Using Micropipet-Supported ITIES Tips Ishimatsu R, Kim J, Jing P, Striemer CC, Fang DZ, Fauchet PM, McGrath JL, Amemiya S. (2010) Analytical Chemistry. 82(17): 7127-7134.