Silicon oxide TEM windows Strength and Quality ControlTEMwindows-Logo
Every batch of TEM windows is tested for robustness and inspected under the TEM. Prior to packaging, each TEM window is individually inspected in an optical microscope. Below you will find burst pressure values for the Silicon oxide membranes.

Below you will find burst pressure values for the Silicon oxide membranes.
temwindow-strength-oxide

Featured publications using Silicon oxide membranes

Silicon Nitride grids are compatible with correlative negative staining electron microscopy and tip-enhanced Raman spectroscopy for use in the detection of micro-organisms. Lausch et al. (2013) J Appl Microbiology. 116: 1521-1530.

Controlling Dielectrics with the Electric Field of Light  Schultze et al. (2013) Nature. 493: 75-78.

Graphene Oxide Windows for In Situ Environmental Cell Photoelectron Spectroscopy  Kolmakov A, Dikin DA, Cote LJ, Huang J, Abyaneh MK, Amati M, Gregoratti L, Günther S, Kiskinova M. (2011) Nature Nanotechnology. 6: 651-657.

Irreversible Chemical Reactions Visualized in Space and Time with 4D Electron Microscopy  Park ST, Flannigan DJ, Zewail AH. (2011) J Am Chem Soc. 130(6): 1730-1733.

Metal-Catalyzed Growth of Semiconductor Nanostructures without Solubility and Diffusivity Constraints Wang Z, Gu L, Phillipp F, Wang JY, Jeurgens LP, Mittemeijer EJ. (2011) Advanced Materials. 23(7): 854-859.

Biological Imaging with 4D Ultrafast Electron Microscopy  Flannigan DJ, Barwick B, Zewail AH. (2010) Proc Natl Acad Sci. 107(22): 9933-9937.