Silicon Nitride membranes (TEM windows) have the advantage of being chemically inert and mechanically robust, being able to withstand temperatures >1000°C. They are particularly suitable for conducting nanotechnology experiments directly on their surface over a wide temperature range.
TEMwindows Strength and Quality Control
Every batch of TEMwindows is tested for robustness and inspected under the TEM. Prior to packaging, each TEMwindow is individually inspected in an optical microscope. Below you will find burst pressure values for Silicon Nitride membranes.
Featured publications using Silicon Nitride membranes
Fabrication of a Lift-Out Grid with Electrical Contacts for Focused Ion Beam Preparation of Lamella for In Situ Transmission Electron Microscopy. Mecklenburg et al. (2013) Microscopy and Microanalysis. 19: 458-459.
Cryo-SiN – A New Substrate to Monitor Viral Mechanisms. Tanner et al. (2013) Microscopy and Microanalysis. 19: 90-91.
Three Dimensional Imaging of Dislocations in a Nanoparticle at Atomic Resolution Chen et al. (2013) Nature. 496(7433): 74-77.
Blueshift of the surface plasmon resonance in silver nano particles: substrate effects. Raza et al. (2013) Opt Express. 21: 27344-27355
Grains and Grain Boundaries in Highly Crystalline Monolayer Molybdenum Disulphide Van der Zande et al. (2013) Nature Materials. 12: 554-561.
Nanopatterning by ion implantation through nanoporous alumina masks Guan W, Ross I, Bhatta U, Ghatak J, Peng N, Inkson B, and Mobus G. (2013) Phys. Chem. Chem. Phys. 15: 4291-4296.
Softening under membrane contact stress due to ultra-thin RU coatings on AU films Romasco-Tremper A, Mohney S, Andre K, Lin J, Muhlstein C. (2013) Materials Science and Engineering A. 565: 172-179.
Twinning and Twisting of Tri- and Bilayer Graphene Brown, L, Hovden R, Huang P, Wojcik M, Muller DA. (2012) Nano Letters. 12(3): 1609-1615.
Real-Time Single-Molecule Imaging of Quantum Interference Juffmann T, Milic A, Müllneritsch M, Asenbaum P, Tsukernik A, Tüxen J, Mayor M, Cheshnovsky O, Arndt M. (2012) Nature Nanotechnology. 7: 297-300.
In Situ Analytical Electron Microscopy for Probing Nanoscale Electrochemistry Meng YS, McGilvray T, Yang MC, Gostovic D, Wang F, Zeng D, Zhu Y, and Graetz J. (2011) The Electrochemistry Society Interface. Fall, 49-52.
MEMS Process Compatibility of Multiwall Carbon Nanotubes Carter et al. (2011) Vacuum Science & Technology B 29(6): 4-12.
Graphene and boron nitride lateral heterostructures for atomically thin circuitry Levendorf et al. (2012) Nature. 488: 627-632.
Tailoring Electrical Transport Across Grain Boundaries in Polycrystalline Graphene Tsen A, Brown L, Levendorf M, Ghahari F, Huang P, Havener R, Ruiz-Vargas C, Muller D, Kim P, and Park J. (2012) Science. 336: 1143-1146.